PRODUCTS: COMPONENT TESTING
Inductance, Capacitance, Impedance measurement
IMPEDANCE ANALYZER IM3570

- |Z|, L, C, R testing
- Testing source frequency: 4 Hz to 5 MHz
- Measuring time: 0.5 msec
- Measure LCR and conduct frequency sweeps simultaneously
LCR HiTESTER 3535

- |Z|, L, C, R testing
- Testing source frequency: 100kHz to 120MHz
- Measuring time: 6msec
LCR HiTESTER 3532-50

- |Z|, L, C, R testing
- Testing source frequency: 42Hz to 5MHz
- Measuring time: 5msec
LCR HiTESTER 3522-50

- |Z|, L, C, R testing
- Testing source frequency: DC, 1mHz to 100kHz
- Measuring time: 5msec
LCR HiTESTER 3511-50

- |Z|, L, C, R testing
- Testing source frequency: 120Hz or 1kHz
- Measuring time: 5msec
Capacitance measurement for production lines
C HiTESTER 3506

- C, D (tan δ), Q testing
- Measure low capacitance
- Testing source frequency: 1kHz, 1MHz
- Measuring time: 2msec
- RS-232C, GP-IB
C HiTESTER 3505

- C, D (tan δ), Q testing
- Measure low capacitance
- Testing source frequency: 1kHz, 100kHz, 1MHz
- Measuring time: 2msec
- RS-232C, GP-IB
C HiTESTER 3504-60

- C, D (tan δ), Q testing
- Measure high capacitance MLCC
- BIN function
- Contact check function
- Testing source frequency: 120Hz or 1kHz
- Measuring time: 2msec
- RS-232C, GP-IB
C HiTESTER 3504-50

- C, D (tan δ), Q testing
- Measure high capacitance MLCC
- BIN function
- Testing source frequency: 120Hz or 1kHz
- Measuring time: 2msec
- RS-232C, GP-IB
C HiTESTER 3504-40

- C, D (tan δ), Q testing
- Measure high capacitance MLCC
- Testing source frequency: 120Hz or 1kHz
- Measuring time: 2msec
- RS-232C
CAPACITANCE HiTESTER 3501

- C testing only
- Testing source signal: 4V DC
- Recharge time measurement method
- Analog meter type
For low resistance measurement (Model 3560 recommended for contact resistance testing)
RESISTANCE HiTESTER RM3542, RM3542-01

- Ideal high speed resistance meter for automated lines
- Testing source: DC
- Fastest measurement time: 0.9ms
- Minimum integration time: 0.1ms
- Finest resolution: 0.1µΩ
RESISTANCE HiTESTER 3541

- For coil up or line resistance measurement to high resistance measurement
- Testing source: DC
- Minimum response time: a few ms
- Sampling rate: 0.6ms ±0.3ms
- Finest resolution: 0.1µΩ
mΩ HiTESTER 3540

- For coil up or line resistance measurement
- Testing source: DC
- Minimum response time: 100ms
- Sampling speed: 16times/sec
- Finest resolution: 10µΩ
AC mΩ HiTESTER 3560

- For contact resistance or battery internal resistance measurement
- Testing source: AC 1kHz
- Minimum response time: 84ms
- Sampling speed: 60times/sec
- Finest resolution: 1µΩ
DIGITAL PRINTER 9203

- Prints out measurement data at fixed intervals
- For 3227, 3540, 3560, 3550 and 3551 model
Battery Testers
BATTERY HiTESTER BT3563

- The Perfect Battery Tester for the Production Line
- Testing source AC 1kHz
- Measure of High-voltage Battery Packs up to 300V
- Measurement time: 18ms
- Finest resolution 0.1µΩ and 10µV
BATTERY HiTESTER BT3562

- The Perfect Battery Tester for the Production Line
- Testing source AC 1kHz
- Measure of High-voltage Battery Packs up to 60V
- Measurement time: 18ms
- Finest resolution 0.1µΩ and 10µV
BATTERY HiTESTER 3561

- The Perfect Battery Tester for the small secondary batteries
- Testing source AC 1kHz
- Measurement time: 10ms
- Finest resolution 0.01mΩ
BATTERY HiTESTER 3555

- For compact secondary batteries: check battery deterioration
- Testing source AC 1kHz
- Finest resolution 100µΩ
BATTERY HiTESTER 3554

- For compact secondary batteries or up to large lead type, to check battery deterioration
- Testing source AC 1kHz
- Finest resolution 1µΩ
NEW PRODUCTS / UPDATES
LAN CABLE HiTESTERModel 3665-20
Advanced Tester for Verifying LAN Cables after Installation
HIOKI POWER QUALITY ANALYZER 3197Affordability and Portability - Easily measure power anomalies with simple operations
HIOKI BATTERY HiTESTER 3554A battery tester optimized for diagnosing UPS batteries
For more product updates, click here to visit Hioki website.